System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
Tessent Streaming Scan Network (SSN) is a system for packetized delivery of scan test patterns. It enables simultaneous testing of any number of cores with few chip-level pins, and reduces test time ...
As semiconductors push into environments once considered untenable, reliability expectations are being redefined. From the vacuum of space and the inside of jet engines to deep industrial automation ...
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