The picture on a TV set used to be the combined product of multiple analog systems, and since TVs had no internal diagnostics, the only way to know things were adjusted properly was to see for ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...

Strategic Test’s Ultrafast UF7221, a 32-channel, 40-MHz pulse-pattern generator, whose output is compatible with ECL, PECL, TTL, LVDS, LVTTL, CMOS, and LVCMOS logic levels, fits onto a full-length PCI ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...