Unfortunately, surfaces milled by Xe plasma FIB may cause undesirable curtaining artefacts on the cross-section, similar to Ga FIB at very high beam currents, when a composite material is processed.
In milling, inefficiency rarely manifests itself suddenly. More often, it is the result of non-optimized energy consumption, ...
What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...
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