Tech Xplore on MSN
Electron microscopy shows 'mouse bite' defects in semiconductors
Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...
Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...
Interesting Engineering on MSN
Ultra-thin electronics to become more efficient with US researchers’ technique to spot defects
Researchers in the United States have developed a new technique that can spot hidden ...
Researchers have shown that hard-to-spot defects in a widely used two-dimensional insulator can trap electrical charges and locally weaken the material, making it more likely to fail at lower voltages ...
Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere ...
Tiny changes at the atomic scale can determine the future of clean energy. In a new study, Tohoku University researchers have revealed how the precise coordination environment surrounding a single ...
Researchers have uncovered an unusual new form of aluminium that challenges long-held assumptions about how this common metal behaves. Researchers at King’s College London have identified an unusual ...
The Schrödinger equation rewrote the rules of matter and forever changed the field of chemistry. Donald Truhlar, a chemist at the University of Minnesota, calls it the “greatest advance of the 20th ...
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